IEC 60749-13:2018

February 2018

International standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Main informations

International IEC standards

February 2018

28 p.

IEC 60749-13:2018

31.080.01 Semiconductor devices in general

Replaced standards (2)

IEC 60749-13:2002

April 2002

International standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere

IEC 60749-13/AC1:2003

August 2003

International standard Cancelled

Corrigendum 1 to publication IEC 60749-13:2002

Need to identify, monitor and decipher standards?

COBAZ is the simple and effective solution to meet the normative needs related to your activity, in France and abroad.

Available by subscription, CObaz is THE modular solution to compose according to your needs today and tomorrow. Quickly discover CObaz!

Request your free, no-obligation live demo