DIN EN IEC 60749-41

DIN EN IEC 60749-41

March 2023
Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020) - German version EN IEC 60749-41:2020

Main informations

Collections

DIN german standards

Publication date

March 2023

Number of pages

26 p.

Reference

DIN EN IEC 60749-41

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1

International kinship

IEC 60749-41:2020

European kinship

EN IEC 60749-41:2020
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