BS EN 60749-20-1:2009

BS EN 60749-20-1:2009

July 2009
Standard Current

Semiconductor devices. Mechanical and climatic test methods - Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

Main informations

Collections

BSI English standards

Publication date

July 2009

Number of pages

38 p.

Reference

BS EN 60749-20-1:2009

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1

International kinship

IEC 60749-20-1:2009

European kinship

EN 60749-20-1:2009
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