BS EN 60749-16:2004

BS EN 60749-16:2004

June 2004
Standard Current

Semiconductor devices. Mechanical and climatic test methods - Particle impact noise detection (PIND)

Main informations

Collections

BSI English standards

Publication date

June 2004

Number of pages

10 p.

Reference

BS EN 60749-16:2004

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1

International kinship

IEC 60749-16:2003

European kinship

EN 60749-16:2003
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